The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Sep. 15, 2014
Applicant:

Deutsches Zentrum Fuer Luft- Und Raumfahrt E.v., Cologne, DE;

Inventors:

Norbert Jakowski, Neustrelitz, DE;

Mohammed Mainul Hoque, Berlin, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/07 (2010.01); G01S 19/09 (2010.01);
U.S. Cl.
CPC ...
G01S 19/07 (2013.01); G01S 19/09 (2013.01);
Abstract

A device and a method determine a sample point specific vertical total electronic content which is the electron content along a sample point specific vertical path that extends through the center of the earth and the sample point. A first inclined total electronic content is determined and refers to the electron content along an inclined beam path. A first and a further sample point along the beam path are selected. An initial sample point specific vertical total electronic content is determined for each sample point. An increment electron content is determined and refers to the electron content of the increment associated with the sample point. A further inclined total electronic content is determined. A sample point specific conversion function is determined. The sample point specific vertical total electronic content is determined from the first inclined total electronic content and the sample point specific conversion function.


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