The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Aug. 04, 2015
The United States of America As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Joel F. Campbell, Poquoson, VA (US);
Bing Lin, Yorktown, VA (US);
Amin R. Nehrir, Yorktown, VA (US);
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Systems, methods, and devices may enhance the apparent sample rate of data collected using Nyquist sampling from a system, such as Continuous Wave (CW) Light detection and ranging ('Lidar'), Radio detection and ranging ('Radar'), or Sound Navigation and Ranging (“Sonar”), that has been modulated with a repeating waveform, such as linear swept frequency, by reordering of the data in the frequency domain. The enhancement of the apparent sample rate may result in a highly interpolated range profile where the data resolution may be enhanced by a factor equal to the number of repeats in the signal being processed, and may result in a highly detained range measurement with a high precision. The various embodiments may combine data from multiple modulation repeats into a single highly interpolated pulse, which may result in a real-time finer range measurement from CW Lidar, Radar, or Sonar systems.