The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Sep. 16, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John B. DeForge, Barre, VT (US);

Terence B. Hook, Jericho, VT (US);

Theresa A. Newton, St. George, VT (US);

Kirk D. Peterson, Jericho, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/3193 (2006.01); G11C 29/14 (2006.01); G11C 29/08 (2006.01); G01R 31/319 (2006.01); G11C 29/12 (2006.01); G01R 31/3187 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); G01R 31/2831 (2013.01); G01R 31/3177 (2013.01); G01R 31/31937 (2013.01); G01R 31/2815 (2013.01); G01R 31/2817 (2013.01); G01R 31/317 (2013.01); G01R 31/319 (2013.01); G01R 31/3181 (2013.01); G01R 31/3187 (2013.01); G01R 31/3193 (2013.01); G01R 31/31813 (2013.01); G01R 31/31903 (2013.01); G01R 31/31905 (2013.01); G01R 31/31915 (2013.01); G11C 29/08 (2013.01); G11C 29/12 (2013.01); G11C 29/12005 (2013.01); G11C 29/14 (2013.01); G11C 2029/1206 (2013.01);
Abstract

Embodiments are directed to a semiconductor wafer having on-wafer circuitry. The on-wafer circuitry includes functional circuitry and first drive circuitry communicatively coupled to the functional circuitry. The on-wafer circuitry further includes test-only circuitry communicatively coupled to the functional circuitry, along with second drive circuitry communicatively coupled to the test-only circuitry. The control circuitry is communicatively coupled to the second drive circuitry and the test-only circuitry, wherein the first drive circuitry is configured to drive the functional circuitry in a first manner, and wherein the control circuitry is configured to control the second drive circuitry to drive the test-only circuitry in a second manner that is independent of the first manner.


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