The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Dec. 29, 2017
Applicant:
Semitronix Corporation, Hangzhou, CN;
Inventors:
Fan Lan, Hangzhou, CN;
Shenzhi Yang, Hangzhou, CN;
Yongjun Zheng, Hangzhou, CN;
Weiwei Pan, Hangzhou, CN;
Assignee:
Semitronix Corporation, Hangzhou, CN;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31722 (2013.01); G01R 31/2882 (2013.01); G01R 31/2886 (2013.01);
Abstract
To improve test efficiency of addressable test chips, an addressable test chip test system includes a test equipment, a probe card and an addressable test chip, the test equipment connects to the addressable test chip through the probe card to constitute a test path, the test system includes a new type of address register, which can provide two test modes for users according to user's needs. A new type of high density addressable test chip can accommodate DUTs of more than 1000/mm.