The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Sep. 14, 2016
Nima Labs, Inc., San Francisco, CA (US);
Scott Sundvor, San Francisco, CA (US);
Steven Portela, San Francisco, CA (US);
Jonathan Ward, San Francisco, CA (US);
John Walton, San Francisco, CA (US);
Jonathan William Kiel, San Francisco, CA (US);
Jeffrey Mekler, San Francisco, CA (US);
Shireen Yates, San Francisco, CA (US);
Jacob Mooney, San Francisco, CA (US);
Dane Weitmann, San Francisco, CA (US);
Joseph Horrell, San Francisco, CA (US);
Nima Labs, Inc., San Francisco, CA (US);
Abstract
A system and method includes a test container for detecting a target substance in a consumable sample, where the test container includes a test container body defining a test container top, a test container bottom opposing the test container top, a first chamber proximal the test container top, and a second chamber proximal the test container bottom, a magnetic diaphragm situated between the first chamber and the second chamber, the magnetic diaphragm obstructing flow of the consumable sample, and the magnetic diaphragm including a magnetic element embedded in the magnetic diaphragm, and a driving element geometrically complementary to the first chamber, the driving element including a consumable sample grinding feature protruding from a surface of the driving element.