The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Mar. 21, 2017
Applicant:

Korea University Research and Business Foundation, Sejong Campus, Sejong-si, KR;

Inventors:

Jinsung Park, Seoul, KR;

Woong Kim, Gwangju, KR;

Joohyung Park, Seoul, KR;

Seongjae Jo, Seoul, KR;

Minwoo Kim, Guri-Si, KR;

Gyudo Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/20 (2019.01); G01N 1/28 (2006.01); B82Y 30/00 (2011.01); B82Y 35/00 (2011.01); C01G 7/00 (2006.01); G01Q 60/24 (2010.01); G01Q 60/28 (2010.01); G01N 21/78 (2006.01); G01Q 60/30 (2010.01); G01N 15/00 (2006.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
G01N 33/20 (2013.01); B82Y 30/00 (2013.01); B82Y 35/00 (2013.01); C01G 7/00 (2013.01); G01N 1/28 (2013.01); G01N 21/78 (2013.01); G01Q 60/24 (2013.01); G01Q 60/30 (2013.01); B82Y 15/00 (2013.01); G01N 2015/0038 (2013.01);
Abstract

Disclosed is a method for detecting toxic metal ions in a sample. The method includes: a) preparing a solution of organic acid-bound gold nanoparticles; b) adding a sample containing toxic metal ions to the solution prepared in a) to allow the gold nanoparticles to aggregate; c) dropping the reaction solution obtained in b) onto a silicon substrate and drying the reaction solution such that the gold nanoparticle aggregates are immobilized on the silicon substrate; and d) analyzing the characteristics of the gold nanoparticles immobilized on the silicon substrate. The method enables the detection of even a trace amount of toxic metal ions in a sample with high sensitivity. Therefore, the method can be applied to the management of water quality in food service providers and hospitals, the measurement of contaminants in water supply and drainage systems, and the management of industrial wastewater. Furthermore, the method is expected to be widely applicable to water purifiers and the food and beverage industry in the future.


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