The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Apr. 04, 2014
Applicant:

Sugentech, Inc., Daejeon, KR;

Inventors:

Seungbum Yoo, Daejeon, KR;

Eunkyung Kim, Daejeon, KR;

Dong Gyu Lee, Daejeon, KR;

Sang Hoon Oh, Jeonju-si, KR;

Mi Jin Sohn, Daejeon, KR;

Assignee:

SUGENTECH, INC., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01); G01N 21/75 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 21/75 (2013.01); G01N 21/8483 (2013.01); G01N 33/54366 (2013.01); G01N 2201/062 (2013.01);
Abstract

A device for detecting analytes in a sample includes (a) n light source units generating light; (b) a reaction strip including (i) a test area illuminated with light from the light source unit and including a material reacting to the analytes, (ii) a control area illuminated with the light from the light source unit and including a control material, and (iii) a background area illuminated with the light from the light source unit; and (c) at least n+1 light receiving units detecting light emitted from the test area, the control area, and the background area of the reaction strip, respectively.


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