The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
May. 23, 2016
Dentsply Sirona Inc., York, PA (US);
Frank Thiel, OberRamstadt, DE;
Gerrit Kocherscheidt, Walldorf, DE;
DENTSPLY SIRONA Inc., York, PA (US);
Abstract
The invention relates to a device for optical 3D measurement of an object using an optical depth-scanning measurement method, comprising at least two light sources, at least two optical means for producing textured patterns and at least one recording means. A first pattern is produced with the aid of a first optical means and projected onto the object to be recorded as a first projection beam. A second pattern is produced with the aid of a second optical means and projected onto the object to be recorded as a second projection beam. The imaging optics is controlled and adjusted in such a way that a sharp focal plane is incrementally varied along an optical axis of the device.