The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Jan. 24, 2017
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Koji Shimada, Ritto, JP;

Tomonori Kondo, Fukuchiyama, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G05B 19/042 (2006.01); G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G05B 19/0428 (2013.01); G05B 19/054 (2013.01); G05B 2219/1215 (2013.01); G05B 2219/13063 (2013.01); G05B 2219/25472 (2013.01); G05B 2219/37526 (2013.01); G05B 2219/37532 (2013.01);
Abstract

An optical measurement device configured for connection to an industrial network, the industrial network functioning to synchronize time between a master device and a slave device, the optical measurement device includes: an interface module configured to receive a synchronization signal transmitted on the industrial network from the master device within a fixed communication cycle; and a measurement unit configured to perform optical measurements in a measurement cycle. The measurement unit synchronizes when a measurement is taken with the communication cycle in accordance with the synchronization signal received by the interface module.


Find Patent Forward Citations

Loading…