The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Dec. 05, 2016
Applicant:
Quality Vision International, Inc., Rochester, NY (US);
Inventor:
David B. Kay, Rochester, NY (US);
Assignee:
Quality Vision International, Inc., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G02B 7/14 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0205 (2013.01); G01B 9/02035 (2013.01); G01B 11/2441 (2013.01); G02B 7/14 (2013.01);
Abstract
An interferometric measuring machine includes an exchangeable lens module system for an optical probe. The probe includes a lens body containing the optical apparatus of an interferometer and a lens module containing an objective lens along an object arm of the interferometer that can be exchanged with other lens modules for varying the measuring characteristics of the probe. The lens modules are adapted to accommodate objective lenses having different focal lengths while maintaining a desired optical path length of the object arm of the interferometer.