The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Jun. 01, 2017
Applicant:
Gagemaker, Lp, Pasadena, TX (US);
Inventors:
Jimmy I. Frank, Pasadena, TX (US);
John R. Wolfe, III, Pasadena, TX (US);
Craig Cloud, New Braunfels, TX (US);
Mark Bewley, Lakehills, TX (US);
Kris L. Dawson, Pearland, TX (US);
Assignee:
Gagemaker, LP, Pasadena, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/10 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01B 5/10 (2013.01); G01D 5/3473 (2013.01);
Abstract
An In-Process Diameter Gage comprises a Position Detection Subsystem, preferably an optical switch and trigger, a Dimension Measurement Subsystem, preferably comprising a wheel of known diameter and a rotation encoder, and a Data Processing Subsystem, all configured and arranged to determine a dimensional property of a rotating part, such as diameter.
Frank, Jimmy. (2019). In-process diameter measurement gage (U.S. Patent No. 10254099). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10254099
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile