The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
May. 30, 2014
Applicant:
Hewlett-packard Development Company, L.p., Houston, TX (US);
Inventor:
David H. Donovan, San Diego, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); G01J 5/00 (2006.01); G01J 1/02 (2006.01); B29C 64/165 (2017.01); B29C 64/386 (2017.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29K 105/00 (2006.01);
U.S. Cl.
CPC ...
B29C 67/0088 (2013.01); B29C 64/165 (2017.08); B29C 64/386 (2017.08); G01J 1/0242 (2013.01); G01J 5/0003 (2013.01); B29K 2105/251 (2013.01); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract
An additive manufacturing system may include a controller to determine an emissivity of a portion of a layer of build material based on a measured optical property of the portion, or based on object design data representing a degree of intended solidification of the portion. The controller may be to determine a temperature of the portion based on the determined emissivity and a measured radiation distribution emitted by the portion.