The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Feb. 10, 2016
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Masafumi Sato, Hara-mura, JP;
Toshihiko Kano, Minowa-machi, JP;
Kenya Kodaira, Azumino, JP;
Kazuo Nomura, Shiojiri, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A63F 9/24 (2006.01); A63B 69/36 (2006.01); G09B 19/00 (2006.01);
U.S. Cl.
CPC ...
A63B 69/3685 (2013.01); G09B 19/0038 (2013.01);
Abstract
A motion analysis apparatus includes an impact analysis unit that specifies a hitting direction of an exercise appliance during impact and a speed of the exercise appliance during the impact by using an output signal from an inertial sensor, and a display unit that displays the hitting direction and the speed in a coordinate system in which a hitting target direction is set.
Sato, Masafumi. (2019). Motion analysis method, motion analysis apparatus, and storage device (U.S. Patent No. 10252137). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10252137
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile