The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Jun. 25, 2014
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Vijay Parthasarathy, Mt. Kisco, NY (US);

Hua Xie, Ossining, NY (US);

Jean-luc Robert, White Plains, NY (US);

Shiwei Zhou, Yorktown Heights, NY (US);

Vijay Thakur Shamdasani, Kenmore, WA (US);

Assignee:

KONINKLIJKE PHILIPS N. V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/469 (2013.01); A61B 8/085 (2013.01); A61B 8/4245 (2013.01); A61B 8/4263 (2013.01); A61B 8/483 (2013.01); A61B 8/485 (2013.01); G01S 7/52036 (2013.01); G01S 7/52042 (2013.01); A61B 8/5207 (2013.01); G01S 15/8915 (2013.01); G01S 15/8925 (2013.01);
Abstract

The present invention relates to an ultrasound elastography system () for providing an elastography measurement result of an anatomical site () a corresponding method. The system () is configured to visualize a suitability for shear wave elastography of the region of interest () to the user within the ultrasound image () and/or to recommend an elastography acquisition plane () for conducting shear wave elastography to the user. By this, proper selection of a location for an elastography measurement may be supported.


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