The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Oct. 27, 2014
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventors:

Ai Yamakawa, Gamagori, JP;

Hisanari Torii, Gamagori, JP;

Norimasa Satake, Gamagori, JP;

Tetsuya Kano, Gamagori, JP;

Ryoichi Aihara, Gamagori, JP;

Assignee:

NIDEK CO., LTD., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/14 (2006.01); A61B 3/12 (2006.01); A61B 3/10 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 3/1225 (2013.01); A61B 3/0041 (2013.01); A61B 3/102 (2013.01); A61B 3/1005 (2013.01); G06T 7/0014 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01);
Abstract

A fundus analysis device includes: a first database which stores layer thickness information of fundus relating to a plurality of eyes having respective long ocular axial lengths; a processor; and memory storing non-transitory computer readable instructions, when executed by the processor, causing the fundus analysis device to execute: an acquisition instruction of acquiring a tomographic image of a fundus of an examinee's eye by an optical coherence tomography device; and an analysis processing instruction of acquiring analysis information relating to layer thickness information of the fundus of the examinee's eye by referring to the first database.


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