The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Apr. 23, 2015
Applicant:

Kabushiki Kaisha Topcon, Tokyo, JP;

Inventors:

Robert Foster, Oakland, NJ (US);

Mutsutaka Ishihara, Tokyo, JP;

Wataru Umeji, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/032 (2006.01); A61B 3/18 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01); A61B 3/103 (2013.01);
Abstract

An optometry apparatus includes an eye chart presentation optical system that presents an optometric chart to an eye to be examined as a subjective eye chart for subjective measurement and a control unit that controls the eye chart presentation optical system to present the optometric chart. The control unit executes an instant presentation of the optometric chart by controlling the eye chart presentation optical system to finish presenting the optometric chart when an instant presentation time has elapsed after starting presenting the optometric chart.


Find Patent Forward Citations

Foster, Robert. (2019). Optometry apparatus and method for subjective measurement using optometric chart (U.S. Patent No. 10251543). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10251543

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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