The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
May. 24, 2013
Ciena Corporation, Hanover, MD (US);
Jun Bao, Ellicott City, MD (US);
Joseph F. Ferment, III, Sykesville, MD (US);
Hua Jiao, Ellicott City, MD (US);
Jean-Luc Archambault, Severna Park, MD (US);
Ciena Corporation, Hanover, MD (US);
Abstract
The embedded apparatus disclosed herein may measure reflection coefficient values associated with back reflections in a fiber optics transmission system during a variable detection window to detect normal conditions, simulated Brillouin scattering (SBS), or excessive back reflections triggering remedial action. For example, the back reflections may indicate normal conditions if the reflection coefficients measured during an entire detection window remained below a threshold or a maximum reflection coefficient observed therein was below the threshold. Alternatively, the back reflections may trigger remedial action if the reflection coefficients measured in the entire detection window exceeded the threshold or a minimum reflection coefficient observed therein was above the threshold. Otherwise, the back reflections may indicate the SBS effect if the reflection coefficients measured during the detection window included points above and below the threshold or the minimum and maximum reflection coefficients observed therein were below and above the threshold.