The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Jan. 25, 2018
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;

Inventors:

Hiromasa Saeki, Nagaokakyo, JP;

Mika Takada, Nagaokakyo, JP;

Assignee:

MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/06 (2006.01); H01G 4/33 (2006.01); H01G 9/04 (2006.01); H01G 4/00 (2006.01); H01G 4/008 (2006.01); H01G 4/12 (2006.01); H01G 4/005 (2006.01);
U.S. Cl.
CPC ...
H01G 4/06 (2013.01); H01G 4/00 (2013.01); H01G 4/005 (2013.01); H01G 4/008 (2013.01); H01G 4/12 (2013.01); H01G 4/33 (2013.01); H01G 9/04 (2013.01);
Abstract

A capacitor that includes a conductive porous substrate having a porous portion; a dielectric layer on the porous portion and containing an oxygen element and at least metal element; and an upper electrode on the dielectric layer. The porous portion has a path integral value of 1 μm/μmto 16 μm/μm, and a porosity of 20% to 90%, and a ratio Z expressed by (1) below is 0.79 or more, where Oand Mrespectively represent signal intensities of the oxygen element and the metal element when the dielectric layer is analyzed by energy dispersive X-ray spectroscopy (EDS), and where Oand Mrespectively represent signal intensities of the oxygen element and the metal element when a reference material having stoichiometric composition of the oxygen element and the at least one metal element constituting the dielectric layer is analyzed by the EDS.


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