The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Apr. 11, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrey Balmin, San Jose, CA (US);

Peter J. Haas, San Jose, CA (US);

John Sismanis, San Jose, CA (US);

Yuanyuan Tian, San Jose, CA (US);

Wenlei Xie, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06K 9/6296 (2013.01);
Abstract

A computer-implemented method, according to one embodiment, includes: generating two or more sample graphs by sampling edges of a current snapshot of a dynamic graph, generating two or more partial results by executing an algorithm on the two or more sample graphs, combining the partial results into a final result, and incrementally maintaining the sample graphs. Edges included in the current snapshot of a dynamic graph and which were added to the dynamic graph in a most recent update thereto are included in each of the generated two or more sample graphs. Moreover, incrementally maintaining the sample graphs includes: subsampling each of the edges of each of the sample graphs at a given time by applying a Bernoulli trial, and combining a result of the subsampling with new edges received in a batch corresponding to the given time to form new sample graphs.


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