The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Jan. 23, 2017
Applicant:

Qiagen Sciences, Llc, Germantown, MD (US);

Inventors:

David Ray Stoops, Wayland, MA (US);

Phillip Alan Veatch, Arlington, MA (US);

Steven Jeffrey Gordon, Weston, MA (US);

Assignee:

Qiagen Sciences, LLC, Germantown, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); G01N 21/64 (2006.01); G06T 7/00 (2017.01); H04N 7/18 (2006.01); G01N 15/14 (2006.01); G06T 7/73 (2017.01); G02B 21/10 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 15/14 (2013.01); G02B 21/10 (2013.01); G02B 21/16 (2013.01); G02B 21/365 (2013.01); G06T 7/73 (2017.01); H04N 7/18 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/144 (2013.01); G06T 2200/32 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract

A DNA flow cell processing method including positioning the flow cell on a stage at a predetermined location relative to a camera, illuminating the flow cell from a side with a first light source to reflect light off the DNA fragment bead locations, obtaining a first image of the flow cell and identifying a first reference pattern of bead locations in the first image, moving at least one of the flow cell and the stage relative to the camera, attempting to reposition the stage at the predetermined location, obtaining a second image of the flow cell, identifying the first reference pattern in the second image, and evaluating a first offset, relative to the camera, between the first reference pattern in the first image and the first reference pattern in the second image.


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