The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Oct. 13, 2017
Fujifilm Corporation, Tokyo, JP;
Takashi Kunugise, Saitama, JP;
Yousuke Naruse, Saitama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An optical system has the entire angle of view at a wide-angle end of not smaller than 90 degrees. A spatial frequency at which an MTF of the optical system acquired using an evaluation wavelength in a region of an image formation plane in which the distance from the center of the image formation plane is not less than 80% and less than 95% of half of the length of a diagonal line of an imaging surface of an imaging element image is not more than 30% is higher at the wide-angle end than at a telephoto end. When F≥√(Fw×Ft) is satisfied (where F indicates the focal length of the optical system when the target image is captured, Fw indicates the focal length at the wide-angle end, and Ft indicates the focal length at the telephoto end), a sharpening processing unit performs a restoration process based on an optical transfer function of the optical system as a sharpening process.