The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Mar. 02, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Terence B. Hook, Jericho, VT (US);
Larry Wissel, Williston, VT (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5072 (2013.01);
Abstract
Methods and systems for checking a wafer-level design for compliance with a rule include identifying nets that cross chip boundaries for each of a set of chip layouts. Interconnected identified nets are combined into one or more virtual ensembles having properties defined by a sum of properties of the respective interconnected nets. Chip layouts related to virtual ensembles that do not comply with a design rule are modified to bring non-compliant virtual ensembles into compliance.