The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Dec. 08, 2015
Sap SE, Walldorf, DE;
Andreas Vogel, Rauenberg, DE;
Andreas Kunstein, Rauenberg, DE;
Dominic Hehn, Speyer, DE;
Mathias Zietzschmann, Wiesloch, DE;
Michael Decker, Graben-Neudorf, DE;
Sigo Henkel, Heidelberg, DE;
Steffen Maier, Mauer, DE;
Susanne Gottlieb, Karlsruhe, DE;
SAP SE, Walldorf, DE;
Abstract
A catalog application includes data for key indicators for performance measurement of applications. The catalog application comprises data for a large number of key indicators that may be compatible for different application. A monitoring application utilizes data for key indicators to measure performance of external applications. A catalog service interface is instantiated to process requests from the monitoring application to the catalog application. The external applications run in different technical environments and are part of different technical landscapes. A request to provide data for key indicators compatible with a first application is received at the instantiated service interface. The key indicators in the catalog application are filtered based on matching the technical characteristics of the first application with the key indicators' prerequisites. The data for the compatible key indicators is provided through invoking a user interface of the catalog application for display within the measuring application.