The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Apr. 10, 2014
Oracle International Corporation, Redwood Shores, CA (US);
Konstantinos Morfonios, Dublin, CA (US);
Leonidas Galanis, San Jose, CA (US);
Kusumaharanadh Poduri, Foster City, CA (US);
Jae Young Yoon, San Mateo, CA (US);
Zhongtang Cai, Redwood Shores, CA (US);
Karl Dias, Foster City, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for leveraging frequent patterns identified in a captured workload are provided. In one approach, multiple frequent patterns detected in a captured workload may be ordered by frequency to determine, for example, which patterns should be targeted for optimization. In another approach, a model of a captured workload is created, where the model comprises nodes that represent templates (which in turn correspond to requests) and edges that represent transitions between templates. The model is used to create an artificial workload, such as a workload that is twice as large as the originally-captured workload. The model may also be edited before creating the artificial workload. In another approach, workload models are compared to identify errors, regressions, or security issues. In another approach, an artificial workload is created for an application that is not yet deployed and then executed to determine whether the artificial workload or the originally-captured workload executed faster.