The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
May. 22, 2018
Sas Institute Inc., Cary, NC (US);
Douglas Allan Cairns, Durham, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Exemplary embodiments relate to the problem of determining measurements in a distributed computing environment in which observations relating to the measurements are distributed amongst two or more nodes. Each node, which stores a number of node-specific observations, makes available its observation count and a number of observation sketches. The observations are merged into an array, and the sketches from each node are combined into overall summary sketches representing a summary of the observations across all the nodes. The summary sketches may then be used to approximate the measurement. The described techniques allow for the computation of arbitrary measurements (i.e., measurements that are not predetermined and for whose calculation the environment is not preconfigured) in a grid computing environment with a technical advantage of having very few rounds of data communication (e.g., two or less) required between the nodes in the computing grid.