The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Jun. 10, 2016
Microsoft Technology Licensing, Llc, Redmond, WA (US);
William Paul Hovis, Sammamish, WA (US);
Garrett Douglas Blankenburg, Sammamish, WA (US);
Peter Anthony Atkinson, Sammamish, WA (US);
Robert James Ray, Snoqualmie, WA (US);
Andres Felipe Hernandez Mojica, Seattle, WA (US);
Samy Boshra-Riad, Bellevue, WA (US);
Erng-Sing Wee, Bellevue, WA (US);
Brian Keith Langendorf, Benicia, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes receiving a voltage characterization service over a communication interface of the computing apparatus as transferred by a deployment platform remote from the computing apparatus. The method includes executing the voltage characterization service for a processing device of the computing apparatus to determine at least one input voltage for the processing device lower than a manufacturer specified operating voltage, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, restarting the processing device using a recovery voltage higher than a current value of the iteratively adjusted voltages.