The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Dec. 20, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Rohit Krishna Koppal, Redmond, WA (US);

Chandrashekar Gernipalli Subba, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/00 (2006.01); G02F 1/13 (2006.01); G09G 3/00 (2006.01); G02F 1/1333 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1309 (2013.01); G02F 1/1333 (2013.01); G09G 3/006 (2013.01); G02F 2201/503 (2013.01);
Abstract

A display includes an integrated strain-gauge layer in or on the display for measuring the strain at a plurality of locations on the display. The display is deformable and secured to a display device by a first chassis. A method includes measuring, over a period of time, strain of the display of a first device at the plurality of locations and recording the strain measurements in a memory of the display device. Strain measurements associated with a failure of the display may be identified. The method may include simulating a dynamic system including a model of a second device. The model of the second device includes a model of a second chassis different than the first chassis and a model of the display associated with the failure. Simulating the dynamic system may include simulating deformation of the model of the display based on the identified strain measurements.


Find Patent Forward Citations

Loading…