The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Sep. 22, 2015
Applicant:
The United States of America, As Represented BY the Secretary, Dept. of Health and Human Resources, Washington, DC (US);
Inventors:
Hari Shroff, Rockville, MD (US);
Andrew York, Rockville, MD (US);
John Giannini, Rockville, MD (US);
Abhishek Kumar, Rockville, MD (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 26/10 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0048 (2013.01); G02B 26/101 (2013.01); G02B 27/58 (2013.01);
Abstract
A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.