The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Mar. 14, 2014
Ohio State Innovation Foundation, Columbus, OH (US);
Yale University, New Haven, CT (US);
Jinghua Wang, Columbus, OH (US);
Zhong-lin Lu, Dublin, OH (US);
Robert Todd Constable, Madison, CT (US);
Ohio State Innovation Foundation, Columbus, OH (US);
Yale University, New Haven, CT (US);
Abstract
Methods for correcting inhomogeneities of magnetic resonance (MR) images and for evaluating the performance of the inhomogeneity correction. The contribution of both transmit field and receiver sensitivity to signal inhomogeneity have been separately considered and quantified. As a result, their negative contributions can be fully corrected. The correction method can greatly enhance the accuracy and precision of MRI techniques and improve the detection sensitivity of pathophysiological changes. The performance of signal inhomogeneity correction methods has been evaluated and confirmed using phantom and in vivo human brain experiments. The present methodologies are readily applicable to correct signal intensity inhomogeneity artifacts produced in different imaging modalities, such as computer tomography, X-ray, ultrasound, and transmission electron microscopy.