The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Feb. 22, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mary P. Kusko, Hopewell Junction, NY (US);

Franco Motika, Hopewell Junction, NY (US);

Gerard M. Salem, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01); G01R 31/31707 (2013.01);
Abstract

Structurally assisted functional test and diagnostics include executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints. One or more built-in structural test support circuits of the device under test is applied to identify one or more likely causes of a failure identified at the one or more checkpoints. A portion of the functional execution sequence between a plurality of the checkpoints is iteratively invoked to progressively isolate the one or more likely causes of the failure as a most likely failure source in combination with one or more results from the one or more built-in structural test support circuits.


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