The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Dec. 12, 2016
Applicant:

United Technologies Corporation, Farmington, CT (US);

Inventors:

Kevin D. Smith, Glastonbury, CT (US);

Jonathan P. Sullivan, Manchester, CT (US);

David A. Raulerson, Palm Beach Garden, FL (US);

Assignee:

United Technologies Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01); G01B 7/14 (2006.01); G01M 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9053 (2013.01); G01B 7/14 (2013.01); G01M 15/14 (2013.01);
Abstract

An exemplary method of inspecting a component includes, among other things, securing an inspection probe body relative to a component, using a sensor assembly housed within the inspection probe body to induce an eddy current in a target area of the component, the target area having a target surface that is spaced from the sensor assembly, sensing a parameter of the eddy current in the component using the sensor assembly, and determining a position of the target surface of the component relative to the inspection probe body using the parameter of eddy current from the sensing.


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