The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Jun. 11, 2018
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventor:
Kazuo Ishiyama, Tokyo, JP;
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01H 9/00 (2006.01); H01S 5/40 (2006.01); G01B 11/02 (2006.01); H01S 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/1702 (2013.01); G01B 11/026 (2013.01); G01H 9/008 (2013.01); H01S 5/0071 (2013.01); H01S 5/0078 (2013.01); H01S 5/4087 (2013.01); G01N 2201/0697 (2013.01);
Abstract
A laser displacement meter includes: a laser array beam source unit including a plurality of lasers emitting beams with different wavelengths; a lens array unit including a plurality of lenses for focusing laser beams; a reflected beam lens array unit including a plurality of focusing lenses for focusing the beam reflected on the surface of the object; an optical filter array unit including a plurality of optical filters through which the reflected beam is selectively transmitted; and a photodetector array unit including a plurality of photodetectors for detecting the beam transmitted through the optical filters.