The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Apr. 24, 2015
Applicants:

Menapic, Lille, FR;

Centre National DE LA Recherche Scientifique (C.n.r.s.), Paris, FR;

Inventors:

Arnaud Devos, Ennetieres en Weppes, FR;

Patrick Emery, Lille, FR;

Arnaud Le Louarn, Lys lez Lannoy, FR;

Assignee:

MENAPIC, Lille, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 1/00 (2006.01); H04B 10/2537 (2013.01); G01N 21/17 (2006.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
G01N 21/1702 (2013.01); G01N 21/636 (2013.01); G01N 2021/1706 (2013.01); G01N 2021/638 (2013.01);
Abstract

The present invention relates to a device () for characterizing an interface of a structure (), said structure () comprising a solid first material and a second material, the materials being separated by said interface. The device () comprises: The invention also relates to a corresponding method of characterization.


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