The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Jul. 31, 2014
William David Mawby, Greenville, SC (US);
Compagnie Generale Des Etablissements Michelin, Clermont-Ferrand, FR;
Michelin Recherche ET Technique S.a., Granges-Paccot, CH;
William David Mawby, Greenville, SC (US);
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, Clermont-Ferrand, FR;
Abstract
Methods and systems for improving the uniformity of a tire are provided. More particularly, one or more parameters of a measurement process harmonic contributing to uniformity measurements performed for a tire can be identified. The measurement process harmonic can be a process harmonic effect associated with the acquisition of uniformity measurements of a tire, such as a process harmonic effect associated out-of-roundness of a road wheel used to load a tire during uniformity measurement in a uniformity measurement machine. The measurement process harmonic can result solely from the acquisition of uniformity measurements and may not contribute to actual tire non-uniformity. Once identified, the one or more parameters associated with the measurement process harmonic can be used to correct the uniformity measurements of the tire to account for the measurement process harmonic. Tire manufacture can then be modified to improve tire uniformity based on the corrected measurements.