The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Sep. 25, 2017
Applicant:
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., München, DE;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/02 (2006.01); G01J 3/04 (2006.01); G01J 3/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/1804 (2013.01); G01J 3/021 (2013.01); G01J 3/0202 (2013.01); G01J 3/0208 (2013.01); G01J 3/0229 (2013.01); G01J 3/0256 (2013.01); G01J 3/04 (2013.01); G01J 3/06 (2013.01); G01J 2003/1885 (2013.01);
Abstract
An optical arrangement for a spectral analysis system, a method for producing an optical arrangement for a spectral analysis system and a spectral analysis system are disclosed. In an embodiment the optical arrangement includes a carrier substrate having a placement area for a frame and a base area, and a diffraction grating movably arranged in the frame, wherein the frame is arranged on the placement area in an inclined placement position with respect to the base area so that the diffraction grating, arranged in a base position, is inclined with respect to the base area.