The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Dec. 09, 2016
Applicant:

Conti Temic Microelectronic Gmbh, Nürnberg, DE;

Inventors:

Dirk Heide, Freinsheim, DE;

Nico Steinhardt, Frankfurt am Main, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/28 (2006.01); G01D 3/08 (2006.01); G01D 5/244 (2006.01); G01D 1/16 (2006.01); G01C 21/16 (2006.01);
U.S. Cl.
CPC ...
G01D 3/08 (2013.01); G01C 21/165 (2013.01); G01D 1/16 (2013.01); G01D 5/24461 (2013.01); G01C 21/28 (2013.01);
Abstract

The disclosure relates to a method for verifying measured data from at least one sensor system. The measured data directly or indirectly describe values of physical quantities The values of indirectly described physical quantities are calculated from the measured data and/or from known physical and/or mathematical relationships. At least three values describing an identical quantity are subjected in pairs to a mutual comparison. In addition, at least two of the at least three values describing an identical quantity are determined independently of one another by at least one sensor system. A third value describing an identical quantity is determined by a basic sensor system. The disclosure further relates to a corresponding system and a use of the system.


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