The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2019
Filed:
Mar. 25, 2015
Applicant:
Siemens Aktiengesellschaft, Munich, DE;
Inventors:
Peter Rentschler, Neuhengstett, DE;
Anton Schick, Velden, DE;
Assignee:
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2509 (2013.01); G01B 11/22 (2013.01);
Abstract
A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern.