The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Oct. 28, 2016
Applicant:

Delta Electronics, Inc., Taoyuan, TW;

Inventors:

Meng-Seng Chen, Taoyuan, TW;

Tien-Szu Lo, Taoyuan, TW;

Hsiang-Pin Lee, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 21/00 (2006.01); G01M 1/38 (2006.01); G05B 13/00 (2006.01); G05B 15/00 (2006.01); G05D 23/00 (2006.01); F24F 11/30 (2018.01); G05B 15/02 (2006.01); F24F 110/10 (2018.01); F24F 110/20 (2018.01); F24F 110/50 (2018.01); F24F 110/70 (2018.01); F24F 120/10 (2018.01); F24F 11/32 (2018.01);
U.S. Cl.
CPC ...
F24F 11/30 (2018.01); G05B 15/02 (2013.01); F24F 11/32 (2018.01); F24F 2110/10 (2018.01); F24F 2110/20 (2018.01); F24F 2110/50 (2018.01); F24F 2110/70 (2018.01); F24F 2120/10 (2018.01);
Abstract

An area abnormality detecting system includes multiple apparatuses, multiple sensors and a detecting server. The system is adopted in a space, which is segmented into several blocks with same size. Multiple areas of the space are defined by the blocks separately. The apparatuses are respectively corresponding to each area for providing environmental improving services. The sensors are respectively corresponding to each area for sensing indoor environment of each area. After an abnormality occurs, the detecting server determines an abnormal area and an occurring time corresponding to the abnormality, and obtains apparatus parameters of apparatuses corresponding to the abnormal area that are recorded at the occurring time, so as to determine the occurring reason for the abnormality based on the apparatus parameters.


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