The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Aug. 14, 2013
Applicant:

Lectra, Paris, FR;

Inventors:

Stephane Bodivit, Cestas, FR;

Didier Chabirand, Cestas, FR;

Assignee:

LECTRA, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B26D 7/02 (2006.01); B26D 5/00 (2006.01); C14B 1/44 (2006.01); C14B 5/00 (2006.01); B26F 1/38 (2006.01);
U.S. Cl.
CPC ...
B26D 7/02 (2013.01); B26D 5/00 (2013.01); B26D 5/005 (2013.01); B26F 1/3813 (2013.01); C14B 1/44 (2013.01); C14B 5/00 (2013.01); Y10T 83/0429 (2015.04);
Abstract

The invention provides a flattening method for flattening the edges of a swatch of flexible material from which pieces are to be cut out. The method comprises: establishing a digital representation of at least a portion of an outline (H) of the swatch of flexible material (H); establishing a specific flattening direction (D, D) and distance (V, V) for each of the points (P, P) of the scanned portion of the outline of the swatch; and for each selected point of the scanned portion of the outline of the swatch, using a presser foot of a cutter tool, to flatten the edges of the swatch along the specific flattening direction and distance established for said point, and along a flattening direction going from within the swatch towards its edges.


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