The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Feb. 18, 2015
Applicant:

Basf Plant Science Gmbh, Ludwigshafen, DE;

Inventors:

Pierre Lejeune, Dolembreux, BE;

Frederik Leyns, Oosterzele, BE;

Cedrick Vandaele, Ghent, BE;

Wim Van Caeneghem, Brakel, BE;

Assignee:

BASF Plan Science GmbH, Ludwigshafen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01G 9/08 (2006.01); A01H 1/04 (2006.01); B65G 15/00 (2006.01); B65G 15/14 (2006.01); A01G 9/02 (2018.01); B65G 43/00 (2006.01); G05B 15/02 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A01H 1/04 (2013.01); A01G 9/02 (2013.01); B65G 15/005 (2013.01); B65G 15/14 (2013.01); B65G 43/00 (2013.01); G05B 15/02 (2013.01); G06T 7/0012 (2013.01); G06T 2207/30188 (2013.01);
Abstract

An improved plant breeding system for high throughput analysis of plant phenotype and genotype is provided. A method for analyzing the impact of genetic modifications on plants and selecting a plant with a genetic modification of interest is also provided. Also provided is a method for developing marketable information for improved plant breeding and a method for collecting data on a selected plant phenotype for rapid analysis of the effect of a genetic modification on the selected phenotype.


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