The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Feb. 23, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Elias Dagher, Aliso Viejo, CA (US);

Yan Wang, San Diego, CA (US);

Mohammad Meysam Zargham, San Diego, CA (US);

Dinesh Jagannath Alladi, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1245 (2013.01); H03M 3/37 (2013.01); H03M 3/396 (2013.01); H03M 3/464 (2013.01); H03M 3/458 (2013.01);
Abstract

Certain aspects of the present disclosure provide methods and apparatus for implementing sampling rate scaling of an excess loop delay (ELD)-compensated continuous-time delta-sigma modulator (CTDSM) analog-to-digital converter (ADC). One example ADC generally includes a loop filter; a quantizer having an input coupled to an output of the loop filter; one or more digital-to-analog converters (DACs), each having an input coupled to an output of the quantizer, an output coupled to an input of the loop filter, and a data latch comprising a clock input for the DAC coupled to a clock input for the ADC; and a clock delay circuit having an input coupled to the clock input for the ADC and an output coupled to a clock input for the quantizer.


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