The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Dec. 28, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Rick A. Wilcox, San Diego, CA (US);

Daniel F. Filipovic, San Diego, CA (US);

Xu Mike Chi, San Diego, CA (US);

Chris M. Rosolowski, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H03L 1/02 (2006.01); H03B 5/30 (2006.01); H03B 5/36 (2006.01); G01K 7/22 (2006.01);
U.S. Cl.
CPC ...
H03L 1/028 (2013.01); G01K 7/22 (2013.01); H03B 5/30 (2013.01); H03B 5/36 (2013.01); H03B 5/364 (2013.01); H03L 1/027 (2013.01);
Abstract

An apparatus includes a temperature measuring device within a thermally conductive package. A crystal within the package is thermally coupled to the temperature measuring device and subjected to a same temperature as the temperature measuring device. A controller external to the package is configured to receive a signal from the crystal and a temperature measurement from the temperature measuring device. The controller is configured to estimate a frequency error of the crystal based on the temperature measurement and to provide a frequency error estimate to an external system.


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