The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Aug. 17, 2015
Applicants:

Gs Yuasa International Ltd., Kyoto-shi, Kyoto, JP;

Xiamen Tungsten Co., Ltd., Xiamen, Fujian, CN;

Inventors:

Daisuke Okuda, Kyoto, JP;

Manabu Kanemoto, Kyoto, JP;

Tadashi Kakeya, Kyoto, JP;

Mitsuhiro Kodama, Kyoto, JP;

Peng Zhang, Fujian, CN;

Zhen Lin, Fujian, CN;

Jinhong Yang, Fujian, CN;

Wenlian Qian, Fujian, CN;

Long Jiang, Fujian, CN;

Assignees:

GS Yuasa International Ltd., Kyoto, JP;

XIAMEN TUNGSTEN CO., LTD., Xiamen, Fujian, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/00 (2006.01); H01M 4/24 (2006.01); C22C 19/03 (2006.01); H01M 4/38 (2006.01); C01B 3/00 (2006.01); C22C 14/00 (2006.01); C22C 21/16 (2006.01); C30B 21/02 (2006.01); C30B 29/52 (2006.01); H01M 8/0606 (2016.01);
U.S. Cl.
CPC ...
H01M 4/242 (2013.01); C01B 3/0031 (2013.01); C01B 3/0057 (2013.01); C22C 14/00 (2013.01); C22C 19/03 (2013.01); C22C 21/16 (2013.01); C30B 21/02 (2013.01); C30B 29/52 (2013.01); H01M 4/38 (2013.01); H01M 4/383 (2013.01); H01M 8/0606 (2013.01); C01P 2002/70 (2013.01);
Abstract

This disclosure provides a hydrogen storing alloy and a production method thereof. The hydrogen storing alloy has a chemical composition of a general formula RMgNi, wherein R is one or more elements selected from rare earth elements comprising Y, x satisfies 0.05≤x≤0.3, and y satisfies 2.8≤y≤3.8. The ratio of the maximal peak intensity present in a range of 2θ=31°-33° to the maximal peak intensity present in a range of 2θ=41°-44° is 0.1 or less (including 0), as measured by X-ray diffraction in which a Cu—Kα ray is set as an X-ray source.


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