The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Nov. 18, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Sang-Wook Park, Hwaseong-si, KR;

Heung-Kook Ko, Hwaseong-si, KR;

No-Young Chung, Hwaseong-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H01L 21/66 (2006.01); G06T 7/00 (2017.01); G06K 9/00 (2006.01); H01L 21/027 (2006.01); G06K 9/52 (2006.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); G06F 17/5081 (2013.01); G06K 9/00536 (2013.01); G06K 9/52 (2013.01); G06T 7/0004 (2013.01); H01L 21/0274 (2013.01); G06F 19/00 (2013.01); G06F 2217/12 (2013.01); G06T 2207/30148 (2013.01);
Abstract

The method includes classifying sample pattern data into a standard normal group and a standard weak group based on a first criterion. The method further includes extracting a normal group determination function by calculating an image parameter with respect to each piece of sample pattern data included in the standard normal group, and extracting a weak group determination function by calculating the image parameter with respect to each piece of sample pattern data included in the standard weak group. The method also includes classifying the object pattern data into a normal group and a weak group by calculating the image parameter with respect to object pattern data based on a first proximity between the normal group determination function and the object pattern data and a second proximity between the weak group determination function and the object pattern data.


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