The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Mar. 24, 2016
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

Scott T. Quarmby, Round Rock, TX (US);

George B. Guckenberger, Austin, TX (US);

Assignee:

THERMO FINNIGAN LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 30/72 (2006.01); H01J 49/04 (2006.01); H01J 49/40 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); G01N 30/7206 (2013.01); G01N 30/7233 (2013.01); H01J 49/04 (2013.01); H01J 49/40 (2013.01); H01J 49/4225 (2013.01);
Abstract

A method includes producing ions from one or more calibrant species and delivering the ions to a mass analyzer, and measuring a first set of mass related physical values for the ions from the one or more calibrant species. The method further includes producing ions from a sample and delivering the ions to a mass analyzer, and measuring a second mass related physical value for a first sample ion species. The first sample ion species has a mass-to-charge ratio outside of the range of the mass-to-charge ratios of the calibrant ion species. Additionally, the method includes calculating a calibration curve based on the first set of mass related physical values and second mass related physical value, and modifying at least one instrument parameter based on the calibration curve.


Find Patent Forward Citations

Loading…