The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
May. 31, 2017
Sandisk Technologies Llc, Plano, TX (US);
Daniel Linnen, Naperville, IL (US);
Srikar Peesari, San Jose, CA (US);
Kirubakaran Periyannan, Santa Clara, CA (US);
Shantanu Gupta, Milpitas, CA (US);
Avinash Rajagiri, San Jose, CA (US);
Dongxiang Liao, Sunnyvale, CA (US);
Jagdish Sabde, Fremont, CA (US);
Rajan Paudel, Fremont, CA (US);
SanDisk Technologies LLC, Addison, TX (US);
Abstract
Techniques are presented for testing the high-speed data path between the IO pads and the read/write buffer of a memory circuit without the use of an external test device. In an on-chip process, a data test pattern is transferred at a high data rate between the read/write register and a source for the test pattern, such as register for this purpose or the read/write buffer of another plane. The test data after the high-speed transfer is then checked against its expected, uncorrupted value, such as by transferring it back at a lower speed for comparison or by transferring the test data a second time, but at a lower rate, and comparing the high transfer rate copy with the lower transfer rate copy at the receiving end of the transfers.