The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

May. 25, 2016
Applicant:

Hirevue, Inc., South Jordan, UT (US);

Inventors:

Benjamin Taylor, Lehi, UT (US);

Loren Larsen, Lindon, UT (US);

Assignee:

HireVue Inc., South Jordan, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/10 (2012.01); G06Q 10/06 (2012.01); G06Q 30/08 (2012.01); G06Q 10/00 (2012.01); G06Q 30/02 (2012.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/1053 (2013.01); G06F 17/3053 (2013.01); G06F 17/30598 (2013.01); G06Q 10/105 (2013.01);
Abstract

Described herein are methods and systems for interview question or prompt recommendation and analysis to improve the quality and efficacy of subsequent evaluation campaigns by combining data sets are described herein. In one method, processing logic selects a first prompt from a first data set of a first candidate evaluation campaign and a second prompt from a second data set of a second candidate evaluation campaign. The processing logic determines whether a degree of similarity between the first prompt and the second prompt exceeds a threshold and combines data from the first data set with data from the second data set to create a combined data set associated with the first prompt and with the second prompt based on the determination.


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