The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Dec. 11, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Kunio Hirakawa, Kanagawa, JP;

Yuichi Nakahata, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06Q 50/10 (2012.01); G06K 9/62 (2006.01); G06K 9/78 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01); G06K 9/6212 (2013.01); G06K 9/6215 (2013.01); G06K 9/6267 (2013.01); G06K 9/78 (2013.01); G06Q 50/10 (2013.01); G06Q 30/0205 (2013.01);
Abstract

A facility use measuring device includes a processor and a memory storing instructions. The processor is configured to set a plurality of staying areas for determining the presence or absence of stay of users on images, to generate stay information relating to the presence or absence of stay of the users for each of the staying areas based on a change situation, to compare pieces of stay information for every at least two staying areas and determine a group configuration regarding the users who respectively stay in the staying areas based on similarity of the pieces of stay information, to generate use information relating a use situation of a facility according to the group configuration, based on the pieces of stay information for each of the staying areas and a determination result of the group configuration, and to generate display information displaying the use information and output the display information.


Find Patent Forward Citations

Hirakawa, Kunio. (2019). Facility use measuring device and facility use measuring system (U.S. Patent No. 10242271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10242271

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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