The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Feb. 03, 2017
Raytheon Company, Waltham, MA (US);
Micky R. Harris, Lompoc, CA (US);
Eric J. Beuville, Goleta, CA (US);
Juliette S. Costa, Santa Barbara, CA (US);
Christian M. Boemler, Goleta, CA (US);
Mark A. Massie, Solvang, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method includes generating an intensity value based on illumination received at a pixel of an imaging system. The intensity value is generated by integrating values using a first counter of a detector during a first period of time. The method also includes integrating the values repeatedly during smaller second periods of time within the first period of time using a second counter of the detector. The second counter has a lower bit resolution than the first counter. The method further includes resetting the second counter for each of the second periods of time. In addition, the method includes generating a pixel event indicator in response to the second counter outputting a specified value. The method may also include determining whether one or more neighboring detectors also generated one or more pixel event indicators and generating an event indicator when the one or more neighboring detectors also generated the one or more pixel event indicators.