The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Oct. 28, 2014
Applicant:

Adobe Systems Incorporated, San Jose, CA (US);

Inventors:

Shiv Kumar Saini, Rajasthan, IN;

Ritwik Sinha, Kolkata, IN;

Iftikhar Ahamath Burhanuddin, Chennai, IN;

John B. Bates, Highland, UT (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30864 (2013.01); G06F 17/3089 (2013.01);
Abstract

Techniques for automatic identification of sources of web metric changes are described. In one or more implementations, changes in a web metric that indicate a measurable attribute associated with a website are determined, and the web metric is analyzed to identify sources that contributed to the changes in the web metric. In implementations, data is queried to obtain actual values for dimension elements along one or more dimensions of the web metric. In addition, expected values for the dimension elements are estimated along the dimensions of the web metric based on historical data. Then, deviations between the actual values and the expected values are calculated by using comparable statistics. Subsequently, the comparable statistics can be analyzed to identify corresponding dimension elements as the sources that contributed to the changes in the web metric.


Find Patent Forward Citations

Loading…